With the continuous expansion of various industries and markets, the competition among enterprises has become more intense. In order to promote the development of the photovoltaic industry, "Millennial Solar" has launched a Stylus Profiler that can measure the surface roughness, waviness, surface 2D/3D shape, and warpage stress of ITO thin films in solar cells. Provide satisfactory testing solutions for photovoltaic enterprise users, helping the stable development of the photovoltaic industry!

E-mail: market@millennialsolar.cn

Stylus Profiler, choose Millennial Solar first

Millennial Stylus Profiler adopts contact surface topography measurement, which can accurately detect the surface information of transparent conductive films. And with its many advantages, it can achieve perfect control from research and development to quality control, thus providing nanometer-level measurement support for products in the fields of semiconductors, photovoltaics, LEDs, MEMS devices, and materials.

Accurate measurement, precise and efficient

Reliable hardware can bring excellent performance. Millennial Stylus Profiler is equipped with a 5-megapixel high-resolution color camera, which can accurately measure the accuracy of the sample, simultaneously transmit the measured topography images to the computer in a visual way, the intuitiveness of the measurement result is realized, and the measurement result is clearly visible.

New measurement technology, measurement of surface profile 

Millennial Stylus Profiler can perform precise measurement on the ITO film. When the probe of the stylus profiler slides over the surface of the ITO conductive film, the steepness of the contacted film surface can change the stretching height of the probe. According to this situation, the movement of the probe can be accurately measured, so as to obtain the parameter information such as the height of the film, the height of the steps, the 2D shape, and the surface roughness.

High repeatability close to 0 error

Millennial Stylus Profiler has sub-angstrom resolution and is equipped with a linear variable differential capacitance sensor (LVDC), which can reach 0.01 angstroms at a measurement level of 13 μm. It has the characteristics of high and low noise ratio and low linearity error, etc. It can scan the topographic features of several nanometers to hundreds of micrometers steps, so that the highly repeatable results of multiple measurements can reach 1nm.

Wide choice of analytical processing and techniques

In order to bring users a better measurement experience, Millennial Stylus Profiler can process the details of the curve in a variety of ways, and supports a variety of measurement standards, so as to analyze various indicators for different types of samples. When Millennial Stylus Profiler analyzes multiple samples at the same time, it can quickly count a large amount of data through the SPC module and display the degree of change and trend of a large number of tested samples.

The market is the touchstone for testing products. With its many advantages, Millennial Stylus Profiler is warmly loved by many enterprises in the photovoltaic market. In the future, "Millennial Solar" will face up to difficulties, combine experience, make repeated adjustments, and continuously optimize and update products so that users can enjoy better services!