Basic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Analysis of Defects in Performance Test
Light Induced Degradation Test
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
Revolutionizing Photovoltaic Manufacturing: In-Line Four Point Probe Tester
As competition in the photovoltaic industry becomes increasingly fierce, optimizing manufacturing processes and improving product quality have become key. In-Line Four Point Probe Tester, through its automation and non-destructive testing technology, provides a revolutionary solution for photovoltaic cell manufacturing. This equipment not only greatly improves production efficiency, but also ensures high performance and reliability of products.
Four-point probe technology
Four-probe testing technology uses four equally spaced probes attached to the semiconductor surface. A constant current source provides an appropriately small current I to the two outer probes, and then measures the difference between the two middle probes. The voltage V between them can be used to calculate the resistivity of the semiconductor. For a thin semiconductor wafer with a thickness W (much smaller than the length and width), the resistivity is ρ=ηW(V/I), where η is the correction coefficient. In particular, for a thin semiconductor wafer with a diameter much larger than the probe pitch, the resistivity obtained is ρ= (π/ln2)W(V/I)= 4.532 W(V/I) [Ω-cm], where W Use cm as the unit.
Multi-point automatic scanning measurement principle
Simultaneous measurements are made at multiple preset points (each probe is connected to a current source and a voltmeter). This layout allows data to be collected from multiple areas simultaneously, providing broader resistivity distribution information.
Visualization of film uniformity in 2D form
Automation integration improves operational efficiency
E-mail: market@millennialsolar.com
In-Line Four Point Probe Tester is designed to be highly compatible with existing production lines to enable automated integration. This device can quickly and accurately measure the sheet resistance of solar cells without manual intervention. Its automation features not only improve detection speed and accuracy, but also reduce measurement deviations caused by human operations.
Schematic diagram of probe structure
Equipment adopts built-in 5-point or 9-point automatic scanning measurement function, equipped with high-precision technology, suitable for fully automated environments. Through precise mechanical positioning system, four probes are automatically placed at multiple key locations on the cell to achieve efficient synchronous data collection. In addition, the tester can be seamlessly integrated with production line technology to support real-time quality inspection during the cell production process without the need for downtime.
This efficient production process not only significantly reduces time delays, but also shortens the manufacturing cycle, greatly improves manufacturing efficiency, and provides photovoltaic manufacturers with continued market competitiveness and economic growth.
Non-destructive testing and piecemeal technology ensure product quality
In the production of solar cells, maintaining low debris rates is key to increasing yields and reducing costs. In-Line Four Point Probe Tester adopts advanced zero debris rates technology, optimizes the electrical contact design, and precisely controls the contact pressure between the probe and the cell to minimize physical damage to the cell during the testing process.
A sophisticated electromechanical system is used to accurately control the contact pressure and position of the measuring probe on the cell, especially when the four-probe method is used to measure resistivity and sheet resistance. By optimizing the probe material (tungsten carbide probe head) and fine-tuning the contact surface design of the probe (tiny and smooth), mechanical damage to thin-film solar cells can be significantly reduced.
In-Line Four Point Probe Tester
High-precision testing equipment specially designed for scientific research. The equipment's tungsten carbide probe head draws on the manufacturing process of mechanical clock movements and uses rubies to ensure high mechanical accuracy and long service life.
E-mail: market@millennialsolar.com
Measuring size: Maximum sample 230mm*230mm
Measuring range: 1mΩ~100MΩ
Number of measurement points: Supports 5-point and 9-point measurement, the time to test 5 points at the same time is ≤5 seconds, and the time to test 9 points at the same time is ≤10 seconds
Measurement accuracy: Ensure the measurement accuracy of the same model and the test error between different test instruments is within ±1%
Extremely high product performance and reliable customer support are the cornerstones of building user trust. In-Line Four Point Probe Tester, manufactured by Millennial Solar, provides manufacturers with an efficient solar cell performance testing tool through its superior testing capabilities, advanced technology applications, and seamless integration with the production line. Looking forward to the future, Millennial Solar will continue to follow the strategy of simultaneously improving quality and service, advancing technology and efficiency, and working with photovoltaic industry partners and users to draw a blueprint for the future of photovoltaic development.
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