Winning the favor of photovoltaic companies with absolute advantages and helping the solar cells produced by manufacturers achieve better changes is what every solar cell and photovoltaic module testing company pursues. Millennial Solar also adheres to this belief and produces the Four-Point Probe Tester to help photovoltaic enterprise users more accurately, scientifically and efficiently characterize the sheet resistance/resistivity of ITO films in solar cells. This equipment has a large measurement range and supports fully automatic scanning, which can help photovoltaic cell manufacturers easily use and achieve high-precision measurement in a short period of time, thereby evaluating the conductive properties of thin film materials!

Four-Point Probe Tester can quickly and automatically scan samples up to 230mm to obtain sheet resistance/resistivity distribution information at different locations of the sample. It can be widely used in photovoltaics, semiconductors, alloys, ceramics and many other fields.

●Ultra-high measurement range, measuring 1mΩ~100MΩ

●High-precision measurement, dynamic repeatability can reach 0.2%

●Fully automatic multi-point scanning, multiple preset schemes can also be customized and adjusted

●Rapid material characterization and automatic correction factor calculation

Ultra-wide measurement field of view, size compatible

The four-point probe can provide a current of about 0.1μA~1A, and has an ultra-wide measurement range of 1mΩ to 100MΩ. The photovoltaic cell manufacturer customizes the measurement range and uses the unique function of the Four-Point Probe Tester for detection after adaptation and adjustment, thereby characterizing the resistivity/square resistance parameters of the solar cell thin film.

The system is easy to use and the screen is intuitive and concise

Four-Point Probe Tester's system emphasizes plug-and-install, just plug it into the system, install the software and start using it. Moreover, Smart Mapping has an intuitive interface and simple design, making the four-point probe easy to use. This function greatly simplifies the measurement of sheet resistance, helping photovoltaic cell manufacturers to achieve the effect of easy use, clear and intuitive picture!

Multiple measurements are scientifically accurate and have extremely low repeatability

In multiple measurements of ITO films of different solar cells, Four-Point Probe Tester can achieve a dynamic test repeatability of only 0.2%, which is a repeatability that is difficult to achieve with other basic equipment. Four-Point Probe Tester can also perform positive and negative polarity measurements to scientifically calculate the average sheet resistance, eliminate any voltage deviation that may occur, and improve measurement accuracy.

Achieve good contact rates and zero fragmentation rates

When measuring the sheet resistance/resistivity of ITO films, the Four-Point Probe Tester is designed with gentle spring-loaded contacts and rounded tips in order to avoid damaging the cell surface during the measurement process, which would lead to subsequent production of solar cells. The pressure of the probe is maintained at 3~5N, which can ensure accurate characterization of the resistivity parameters of the ITO film while preventing the probe from piercing the film and damaging the solar cell.

Preset multi-point automatic scanning measurement

The most significant difference between Four-Point Probe Tester and traditional thin film detection instruments is that traditional thin film detection instruments can only measure thin film materials through manual calibration. The efficiency of this kind of measurement is very low and also It is likely to lead to differences between the thresholds of each measurement, causing a series of subsequent detection problems.

Schematic diagram of multi-point preset scanning measurement

The Four-Point Probe Tester is different from previous film inspection instruments. This equipment adheres to two measurement functions: fully automatic and manual inspection, and is compatible with a maximum stroke of 230mm x 230mm. If photovoltaic cell manufacturers want to understand the difference in film resistivity between different thresholds in the same cell, they can use the 3-point, 5-point and multi-point fully automatic preset scanning functions of Four-Point Probe Tester for testing, helping photovoltaic cell manufacturers greatly reduce detection time, and assist the subsequent production of solar cells through high-precision detection.

Quickly characterize film performance parameters

After testing the properties of the thin film material of the solar cell, The Four-Point Probe Tester can use Smart Mapping to quickly characterize the resistance, resistivity, conductivity and other parameters of the thin film, and automatically perform correction factor calculations during the characterization process. It can greatly reduce the characterization time after detection and ensure accurate characterization!

Using The Four-Point Probe Tester produced by Millennial Solar to test the performance of solar cell ITO films and various film materials can help photovoltaic cell manufacturers put the produced solar cells into scientific and reasonable use. In the future, Millennial Solar will continue to produce high-quality, high-performance solar cell and module testing equipment, adding strength to the development of the photovoltaic industry!