Thin film thickness has always been the most direct factor affecting the photoelectric conversion rate of solar cells. In order to ensure that the thickness of the film can be measured more quickly and more accurately after completing the cell production line, battery manufacturers understand the impact of its thickness on the performance of solar cells. And its optical constants need to be detected by optical film thickness detection instruments. Therefore, Millennial Solar produced POLY Built-in Thin Film Thickness Measurement Instrument, which uses the photovoltaic industry's leading innovative micro-nano film optical measurement technology and is suitable for large-scale production line automated inspection processes, helping cell manufacturers complete ITO film deposition. The process and the deposition process of numerous thin film materials can be used to conduct physical testing of the film thickness of large-scale solar cells in a short period of time, and can ensure extremely low repeatability among the numerous film thickness parameters obtained from large-scale testing.

POLY Built-in Thin Film Thickness Measurement Instrument——Optical Thin Film Inspection

Market demand is a key factor in generating product income. In the photovoltaic industry, accurate data on film thickness is difficult to accurately detect, and even if it is detected, it is difficult to achieve large-scale industrial measurement. In order to make the two compatible, Millennial Solar has produced POLY Built-in Thin Film Thickness Measurement Instrument, which can accurately detect film thickness while being connected to the industrial testing process, allowing cell manufacturers to improve their deposition process production lines, using this equipment to conduct large-scale systematic testing, thereby helping cell manufacturers greatly save testing time, improve production efficiency and quality assurance!

E-mail:market@millennialsolar.cn

POLY Built-in Thin Film Thickness Measurement Instrument is a Built-in Thin Film Thickness Measurement Instrument specially designed for photovoltaic process monitoring. It can quickly and automatically scan the sample at 5 points simultaneously to obtain film thickness distribution information at different locations of the sample. Customized measurement dimensions according to customer sample size.

●  Effective spectral range 320nm~2400nm

●  Fast, automatic 5-point synchronous scanning

●  Repeatability accuracy <0.5nm

●  Super wide measurement range 20nm~2000nm

●  Online monitoring and detection to achieve zero fragmentation rate

●  Realize automatic inspection of the entire production line, greatly saving inspection time

Thin film optical measurement technology - enabling micro and nano level measurements

 POLY Built-in Thin Film Thickness Measurement Instrument adopts innovative micro-nano thin film optical measurement technology, which can optically detect various types of thin film materials and feedback accurate performance parameters. This equipment utilizes the principle of optical interference and analyzes the spectrum formed by the interference of the reflected light on the surface of the film material and the reflected light at the interface between the film and the substrate. It can carry out large-scale industrialized thin film material detection in a short period of time.

Stable and uniform spectrum, precise and accurate measurement

 Different from traditional thin film testing equipment, POLY Built-in Thin Film Thickness Measurement Instrument uses a tungsten halogen light source, which can ensure an effective spectral range of 320nm to 2400nm and can emit a continuous spectrum. The spectrum covers all light bands from ultraviolet to infrared. With just one piece of equipment, POLY Built-in Thin Film Thickness Measurement Instrument, you can achieve a measurement range that can only be achieved by multiple machines, and ensure the accuracy of the measurement results while achieving an ultra-wide measurement range.

 In order to ensure that the solar cells can smoothly carry out subsequent processes and be put into use normally after completing the deposition process, thereby providing a relatively excellent photoelectric conversion rate, it is necessary to optically detect the film thickness of the solar cells after completing the film deposition process. POLY Built -in Thin Film Thickness Measurement Instrument can use its unique advantages and optical technology to provide a reasonable scientific evaluation of the deposition process, helping solar cell manufacturers to carry out subsequent production and effectively optimize solar cells!