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Basic Characterization of Solar Cell

IV Tester

ITO Anti-reflection Layer

Spectrophotometer

Four-Point Probe Tester

In-Line Four Point Probe Tester

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Grid Line Characterization

Contact Resistance Tester

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Cell Production

Steady State Solar Simulator for Solar Cell

Solar Cell Comprehensive Tensile Tester

Vision Measuring Machine

Thermal Profiler

PV-Reflectometer

Analysis of Defects in Performance Test

Appearance Inspection Platform

Wet Leakage Current Tester

Light Induced Degradation Test

Steady State Solar Simulator for PV Module

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Hipot Tester

Bypass Diode Thermal Tester

Impulse Voltage Tester

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Potential Induced Degradation (PID) Tester

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Environment Induced Decay Aging Test

Humidity Freeze Test Chamber

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Thermal Cycling Chamber

Material UV Preconditioning Test Chamber

Module UV Preconditioning Test Chamber

Stress Induced Decay Damage Test

Dynamic Mechanical Load Tester

Static Mechanical Load Tester

Hail Impact Tester

Material Performance and Aging Testing

EVA Gel Content Test Chamber

Universal Testing Machine

Solar Cell Comprehensive Tensile Tester

Surface/Volume Resistivity Tester

Voltage Breakdown Tester

R&D and Preparation of Perovskite

Slit coater

IV Tester

Stylus Profiler

MPPT

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PV-Reflectometer RTIS
PV-Reflectometer RTIS
PV-Reflectometer RTIS
RTIS PV-Reflectometer can test the reflectivity intensity of textured silicon wafers to light in different wavelength bands. The test results will be calculated through the software on the photoelectric signal and finally presented in a visual curve to systematically characterize the reflectivity characteristics.
RTIS PV-Reflectometer is suitable for measurement of the reversal rate, lowest wavelength point of reflectivity, total reflected energy within the specified band range of the rough surface of single polycrystalline silicon texturing, coating, etching, MCCE and RIE and other front-end processes.
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SPECIFICATIONSTRENGTH DOWNLOAD
Content Specification
Spectral test range 350nm~1050nm
Reflectivity test range 0-100%
Repeatability ＜0.05%
Test speed About 0.1s per second
Test parameters Reflectivity
Mapping function Arbitrary multi-point automatic testing
Related Information
Research on Reducing Reflection Loss in Perovskite/Silicon Tandem Solar Cells
Perovskite solar cells are solar cells that use perovskite crystals as the main light-absorbing material. They have the advantages of high photoelectric conversion efficiency, simple structure, diversified preparation processes, and low cost. At present, the theoretical conversion efficien
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