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Basic Characterization of Solar Cell

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PV-Reflectometer RTIS
PV-Reflectometer RTIS
PV-Reflectometer RTIS
PV-Reflectometer RTIS
PV-Reflectometer RTIS
RTIS PV-Reflectometer can test the reflectivity intensity of textured silicon wafers to light in different wavelength bands. The test results will be calculated through the software on the photoelectric signal and finally presented in a visual curve to systematically characterize the reflectivity characteristics.
RTIS PV-Reflectometer is suitable for measurement of the reversal rate, lowest wavelength point of reflectivity, total reflected energy within the specified band range of the rough surface of single polycrystalline silicon texturing, coating, etching, MCCE and RIE and other front-end processes.
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SPECIFICATIONSTRENGTH DOWNLOAD
Content Specification
Spectral test range 350nm~1050nm
Reflectivity test range 0-100%
Repeatability ＜0.05%
Test speed About 0.1s per second
Test parameters Reflectivity
Mapping function Arbitrary multi-point automatic testing
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