Basic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Analysis of Defects in Performance Test
Light Induced Degradation Test
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
FPP230A is a scanning four-probe resistance tester specially designed for photovoltaic applications. It can quickly and automatically scan samples up to 230mm in size to obtain square resistance/resistivity distribution information at different positions of the sample. The probe head uses ruby bearings to guide the tungsten carbide probe, ensuring high precision and long life. The dynamic test repeatability (close to the real scene) can reach 0.2%, which is the leading level in the industry. The ultra-wide measurement range of 1mΩ~100MΩ can cover most application scenarios, and can be widely used in many fields such as photovoltaics, semiconductors, alloys, and ceramics.
•Fully automatic multi-point scanning: a variety of preset schemes are available, and the test scheme can also be customized
•Manual arbitrary point measurement: only need to provide coordinates, one-key measurement
•Precision Probe Head: The probe head is inlaid with a ruby sleeve to ensure the mechanical accuracy, stability and life of the measurement
•Ultra-wide measurement range: 1 mΩ~100 MΩ
•Maximum sample size: 230 mm*230 mm*10 mm
•Measurement speed: ~2 seconds/point
•Measurement accuracy: ±1%
•Repeatability (1σ): ±0.2% (dynamic test)
•±0.02% (static test)
•Data visualization: Color-coded plots
•Automatic data storage: stored in EXCEL format for later data analysis
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