Email：market@millennialsolar.com
Email：market@millennialsolar.comBasic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Analysis of Defects in Performance Test
Appearance Inspection Platform
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
Environment Induced Decay Aging Test
Contact resistance is an important aspect to be considered in the optimization of solar cell electrode. The contact resistance is not only related to the contact pattern, but also to the diffusion process and PN Junction formation process. The measurement of contact resistivity can reflect the problems existing in the process of diffusion, electrode formation and PN Junction formation.
There are two test functions can be switched: 1. Contact resistivity test; 2.Finger line resistance.
| Content | Specification |
|---|---|
| Applicable solar cell types | Size 230mm and below, thickness 100-220μm |
| Stage control | Precision electric cylinder for precise control, stroke 250mm x 250mm, with vacuum adsorption, microscope lens auxiliary alignment |
| Test Range | Contact resistivity: 0.1~120mΩ*cm*2；
Line resistance measurement range: 0.2~40Ω/cm |
| Measurable sample width | 5-10mm |
| Constant current source | 1mA-10mA |
| Resistance resolution | 1uΩ |
| Measure current | 10mA (open and replaceable) |
| Test repeatability | Static measurement ≤ 1.5%, dynamic measurement ≤ 4% (dynamic: 5 tests) |
| Measurement pressure release control | Using a precision electric displacement axis, the program intelligently controls the pressing amount of the probe, and the control accuracy is as high as 5um |
| Measurement method | Automatic X, Y, Z direction |
| Number of measured points | 4-8 |
| Basic indicators of the probe | Basic indicators of the probe
Probe diameter: 0.9mm Probe pressure: 0.4~0.7N adjustable Probe life: >100000 times Insulation resistance between pins: ≥1000MΩ Mechanical wandering rate: ≤0.3% Probe: tungsten carbide or high speed steel Ф0.5mm |
| Probe spacing | Standard configuration: 1.1.0-1.2mm adjustable probe 2.0.9mm fixed probe; 3. Optional: other specifications can be customized as required |
| Software function | 1. Test data analysis and storage function 2. Measurement data can be exported to Excel format 3. Test data can generate histograms |
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