Quantum Efficiency Measurement System <br/>MNPVQE-300-Millennial Solar-Photovoltaic Cell&Module Test, HJT/TOPCon/Perovskite Solar Cell, IEC61215, IEC61730

Quantum Efficiency Measurement System
MNPVQE-300

The MNPVQE-300 Photovoltaic QE System is a common tool in photovoltaic research and production line quality processes for accurate determination of solar cell spectral response/EQE (IPCE) and IQE.

The MNPVQE-300 is compatible with a wide range of photovoltaic device types, materials, and architectures, including c:Si, mc:Si, a:Si, µ:Si, CdTe, CIGS, CIS, Ge, dye-sensitized, organic/polymer, tandem, multi-junction (2-, 3-, 4-junction, etc.), quantum well, quantum dot, chalcogenide, and perovskite.

APPLICATIONSADVANTAGESSPECIFICATION DOWNLOAD

EQE/IQE Test of Photovoltaic Devices

External quantum efficiency (EQE)/internal photon conversion efficiency (IPCE), defined as the number of electrons provided to the external circuit for each photon incident on the device, can be directly obtained from the spectral response.

•Measurement of the total reflectivity (diffuse and specular) and total transmittance (diffuse and normal) of the device with the aid of an integrating sphere

•The measured spectral response can be used to predict the expected device short-circuit current density J sc under AM1.5 standard test conditions

•Photovoltaic device IV measurements, used to determine device J sc and I sc , should be performed under AM1.5 lighting

Measurement of Four-Junction Photovoltaic Cells

As photovoltaic technology develops, the capabilities of MNPVQE-300 are also developing. Here we introduce the measurement of spectral response/EQE and IQE of multi-junction solar cells.

•Multi-junction photovoltaic cells are epitaxially grown on a substrate and interconnected by tunnel diodes

•Proper measurement of multi-junction PV devices requires the use of optimized optical biasing for all junctions and voltage biasing for the bottom junction

•After determining the spectral response of all component junctions, the EQE can be calculated directly, and the IQE can be calculated by adding a reflectance measurement using the DTR6 integrating sphere accessory.

Content	Specification
Test platform
Type	Gold-plated cell test platform
Size	230 x 230 mm
Function	210 cell test, gold-plated copper plate with vacuum adsorption function; supports front-to-back, front-to-front contact measurement
Environmental temperature	Less than 25℃
Sample temperature	15-65℃（±1°C）
Adjustable monochromatic light source
Light source	75W xenon light source (light source wavelength 250nm to 1500nm) and 100W quartz halogen lamp (light source wavelength 250nm to 3000nm)
Monochromator configuration	Focal length: 300mm, built-in 2 Gratings/ gratings
Grating	Standard built-in 2 Gratings: 1200g/mm; 600g/mm, wavelength accuracy: ± 0.2 nm (1200g/mm), 0.4nm(600g/mm)
Bandwidth	One fixed front entrance slit and one fixed side exit slit, as well as slits for use with PVE300
Probe	Fiber optic probe: magnetic base contact probe
Temperature controlled vacuum mount controller
Temperature control	Based on Peltier controller, water pump and vacuum supply
Bias light
Uniformity	Uniform illumination (±1%) within 1x1cm area
Filter size	50x50mm
Light source	Quartz halogen light source
Detector
Diode type	Silicon photodiode (300-1100nm), Germanium photodiode (800-1800nm)
Reference standard	German PTB
Integrating sphere
Dimensions	150mm diameter
Detector	Si/Si-InGaAs detector
Software
QE test software	BENWIN PLUS measurement software: Calibrate/generate: SR, EQE, IQE, R (reflection), T (transmission) test data and charts.
Current loss analysis software	LAS loss analysis: current loss analysis and calculation, FF loss analysis can also be performed.
General
Interfaces	USB 2.0
Software Control	BENWIN + Windows Applications
Power Supply	110/220V，50/60Hz

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