Basic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Analysis of Defects in Performance Test
Light Induced Degradation Test
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
Long-term leakage current will cause changes in the state of the battery carrier and depletion layer, corrosion of the contact resistance in the circuit, electrochemical corrosion of the packaging material, etc., resulting in power attenuation of the battery, increase in series resistance, and light transmittance. Reduction, delamination and other phenomena that affect the long-term power generation and life of the module.
What is Potential Induced Degradation (PID) test?
PID test is a quality assurance test performed on manufactured modules to predict how they will perform under different conditions over time. For the PID test of solar modules, the modules are placed at a temperature of 85°C with a humidity of about 85% and under a load of 1000v for 96 hours. PID testing simulates power loss under the sub-voltage and temperature conditions to which a component is exposed.
How to conduct a Potential Induced Degradation (PID) test?
For the test, a module-like stack of solar cells, polymer foil and glass layers was placed between two metal electrodes. While heating the bottom (ground) electrode, a high positive voltage (voltage equivalent to PID) is applied to the upper electrode of the module.
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