Basic Characterization of Solar Cell
In-Line Four Point Probe Tester
Amorphous/microcrystalline Silicon Materials
Steady State Solar Simulator for Solar Cell
Analysis of Defects in Performance Test
Light Induced Degradation Test
Potential Induced Degradation Test
Reverse Current Overload Tester
Potential Induced Degradation (PID) Tester
Current Continuity Test System
The quality of bypass diodes directly affects the power generation of photovoltaic power plants, so the ME-PV-BDT-18 developed by Millennial can effectively test the performance of diodes. Executive standard: IEC 61215-2:2021 "Bypass diode function test, thermal performance test" IEC 62979:2017 "Bypass diode thermal runaway (thermal runaway) test".
Features
•Can test and record diode forward/reverse voltage, diode temperature, component temperature and other parameters
•Switching between forward voltage and reverse voltage within 10ms by fast circuit converter
•Can quickly record the change of diode voltage, current and temperature during the circuit conversion process
•Application of reverse voltage can be controlled by temperature
Fast Delivery & Comprehensive Support
Provide customers with comprehensive support from product to production line operation through on-site operation guidance and after-sales technical support.
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