Photovoltaic Cell Test-Development of High-efficiency Silicon Cell

1. After the solar cell is exposed to light, photons with energy less than the band gap width are not absorbed and directly transmitted through the cell;
2. Photons with energy greater than the band gap width will be absorbed to produce electron hole pairs, which will cause a part of energy loss of high-energy photons;
3. Charge separation and transport of photogenerated carriers, loss in pn junction;
4. The recombination loss in the transport process of photogenerated carriers;
5. Another voltage drop at the output of voltage causes contact voltage loss.

Reduce Electrical Loss

1. Select silicon wafers and types with good crystal structure;
2. Developing ideal pn junction forming technology;
3. Develop ideal passivation technology;
4. Adopt reasonable metal contact technology;
5. Excellent frontcourt and backcourt technology.

Reduce Optical Loss

In order to reduce the optical loss and improve the efficiency of the battery, various high trapping theories and technologies have been developed, including silicon wafer surface texture technology to reduce reflection, front surface antireflective coating technology, rear surface reflective coating technology and small grid line shielding area technology.

Which equipment will be applied to the research and development of silicon
photovoltaic machinery?

✔IV Tester ✔ PL/EL Tester ✔ 3D Microscope ✔ Four-Point Probe Resistance Measurement ✔ TLM Contact Resistance Tester ✔ Scanning Electron Microscope